Zobacz książki o podobnej tematyce

Więcej informacji o VLSI Design and Test

• Dane szczegółowe
• Opis
• Ulubione w innej kategorii

Za ten zakup dostaniesz 304 punkty

Opis

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Szczegóły książki

Kategoria Książki po angielsku Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Pełny tytuł: VLSI Design and Test
• Podtytuł: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
• Autor: Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 815
• EAN: 9789811074691
• ISBN: 9811074690
• ID: 18381771
• Wydawca: Springer Verlag, Singapore
• Waga: 1264 g
• Wymiary: 235 × 155 × 50 mm
• Data wydania: 22. December 2017

Ulubione w innej kategorii

---

---

---