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Opis

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.

Szczegóły książki

• Pełny tytuł: Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
• Autor: Mahtab Niknahad
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 162
• EAN: 9783731500384
• ID: 01995697
• Wydawca: Karlsruher Institut Fur Technologie
• Waga: 268 g
• Wymiary: 244 × 170 × 9 mm
• Data wydania: 22. May 2014

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