Kod: 25367586
Abstract: Fluctuation phenomenon (both thermal and shot noise) were measured in the junctions of bipolar junction transistors (BJT's) at liquid nitrogen temperatures and beyond. Dissertation Discovery Company and the University of ... więcej
Za ten zakup dostaniesz 239 punkty
Abstract: Fluctuation phenomenon (both thermal and shot noise) were measured in the junctions of bipolar junction transistors (BJT's) at liquid nitrogen temperatures and beyond. Dissertation Discovery Company and the University of Florida are dedic
Kategoria Książki po angielsku Technology, engineering, agriculture Technology: general issues Nanotechnology
95.27 €
Osobní odběr Bratislava a 2642 dalších
Copyright ©2008-24 najlacnejsie-knihy.sk Wszelkie prawa zastrzeżonePrywatnieCookies
Nákupní košík ( prázdný )