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Opis

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

Szczegóły książki

Kategoria Książki po angielsku Mathematics & science Mathematics Applied mathematics

• Pełny tytuł: Digital Noise Monitoring of Defect Origin
• Autor: Telman Aliev
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 224
• EAN: 9780387717531
• ISBN: 0387717536
• ID: 01382491
• Wydawca: Springer-Verlag New York Inc.
• Waga: 1120 g
• Wymiary: 235 × 155 × 14 mm
• Data wydania: 25. July 2007

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