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Opis

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system, i.e., transaction-level, RTL and gate-level. The authors demonstrate how to apply automated debug approaches to a hardware system at different granularities, in order to find the possible location of bugs and faults. They employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions, and their automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. The debug automation for electrical faults (delay faults) described finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, enabling readers to shorten the IC development cycle and increase the productivity of their designs.

Szczegóły książki

Kategoria Książki po angielsku Computing & information technology Computer science Computer architecture & logic design

• Pełny tytuł: Debug Automation from Pre-Silicon to Post-Silicon
• Autor: Mehdi Dehbashi, Görschwin Fey
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 171
• EAN: 9783319093086
• ISBN: 3319093088
• ID: 02782990
• Wydawca: Springer, Berlin
• Waga: 450 g
• Wymiary: 242 × 163 × 6 mm
• Rok wydania: 2014

Ulubione w innej kategorii

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