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Opis

This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.

Szczegóły książki

Kategoria Książki po angielsku Mathematics & science Chemistry Analytical chemistry

• Pełny tytuł: Cluster Secondary Ion Mass Spectrometry - Principles and Applications
• Autor: Christine M. Mahoney
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 368
• EAN: 9780470886052
• ISBN: 0470886056
• ID: 02514784
• Wydawca: John Wiley & Sons Inc
• Waga: 762 g
• Wymiary: 165 × 243 × 21 mm
• Data wydania: 28. June 2013

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