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Opis

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

Szczegóły książki

Kategoria Książki po angielsku Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Pełny tytuł: Built-in-Self-Test and Digital Self-Calibration for RF SoCs
• Autor: Sleiman Bou-Sleiman, Mohammed Ismail
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 89
• EAN: 9781441995476
• ISBN: 1441995471
• ID: 01424549
• Wydawca: Springer-Verlag New York Inc.
• Waga: 180 g
• Wymiary: 235 × 155 × 7 mm
• Data wydania: 22. September 2011

Ulubione w innej kategorii

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