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Opis

The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.

Szczegóły książki

Kategoria Książki po angielsku Mathematics & science Physics Classical mechanics

• Pełny tytuł: Advances in X-Ray Analysis
• Podtytuł: Volume 28
• Autor: Charles S. Barrett, Paul K. Predecki
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 408
• EAN: 9780306419393
• ISBN: 0306419394
• ID: 01376657
• Wydawca: Springer Science+Business Media
• Waga: 970 g

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