VLSI Test Symposium (Vts 2003) / Najlacnejšie knihy
VLSI Test Symposium (Vts 2003)

Code: 23164695

VLSI Test Symposium (Vts 2003)

by Ieee

The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.

183.19

RRP: 192.18 €

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Book synopsis

The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.

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183.19



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