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Book synopsis

The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips--

Book details

Book category Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Full title: Thermal-Aware Testing of Digital VLSI Circuits and Systems
• Author: Chattopadhyay, Santanu (Department of Electronics and Electrical Communication EngineeringIndian Institute of Technology Kharagpur, West Bengal, India
• Language: English
• Binding: Hardback
• Number of pages: 118
• EAN: 9780815378822
• ISBN: 9780815378822
• ID: 18912854
• Publisher: Taylor & Francis Inc
• Weight: 296 g
• Dimensions: 145 × 225 × 14 mm
• Date of publishing: 25. April 2018

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