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Book synopsis

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Book details

Book category Books in English Mathematics & science Science: general issues Scientific standards

• Full title: Progress in Transmission Electron Microscopy 2
• Subtitle: Applications in Materials Science
• Author: Xiao-Feng Zhang, Ze Zhang
• Language: English
• Binding: Paperback
• Number of pages: 307
• EAN: 9783642087189
• ISBN: 3642087183
• ID: 01653682
• Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Weight: 499 g
• Dimensions: 235 × 155 × 18 mm
• Date of publishing: 19. October 2010

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