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Book synopsis

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Book details

Book category Books in English Mathematics & science Science: general issues Scientific standards

• Full title: Noncontact Atomic Force Microscopy
• Author: E. Meyer, S. Morita, Roland Wiesendanger
• Language: English
• Binding: Paperback
• Number of pages: 440
• EAN: 9783642627729
• ISBN: 9783642627729
• ID: 06617965
• Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Weight: 692 g
• Dimensions: 235 × 155 × 25 mm
• Date of publishing: 23. October 2012

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