Code: 02439156
Materials Reliability in Microelectronics II: Volume 265
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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Book synopsis
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book details
Book category
Books in English
Technology, engineering, agriculture
Mechanical engineering & materials
Materials science
- Full title: Materials Reliability in Microelectronics II: Volume 265
- Author: C. V. Thompson, J. R. Lloyd
- Language: English
- Binding: Paperback
- Number of pages: 344
- EAN: 9781107409682
- ISBN: 1107409683
- ID: 02439156
- Publisher: Cambridge University Press
- Weight: 46 g
- Dimensions: 229 × 152 × 18 mm
- Date of publishing: 05. June 2014
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