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Book synopsis

This volume presents a concise introduction to Kelvin probe force microscopy. The text discusses potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.§

Book details

Book category Books in English Technology, engineering, agriculture Mechanical engineering & materials Materials science

• Full title: Kelvin Probe Force Microscopy
• Subtitle: Measuring and Compensating Electrostatic Forces
• Author: Sascha Sadewasser, Thilo Glatzel
• Language: English
• Binding: Paperback
• Number of pages: 334
• EAN: 9783642271137
• ISBN: 3642271138
• ID: 02255881
• Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Weight: 554 g
• Dimensions: 236 × 156 × 23 mm
• Date of publishing: 29. November 2013

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