Introduction to Focused Ion Beam Nanometrology / Najlacnejšie knihy
Introduction to Focused Ion Beam Nanometrology

Code: 12446872

Introduction to Focused Ion Beam Nanometrology

by David C. Cox

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metr ... more

111.94 €


In stock at our supplier
Shipping in 15 - 20 days
Add to wishlist

You might also like

Give this book as a present today
  1. Order book and choose Gift Order.
  2. We will send you book gift voucher at once. You can give it out to anyone.
  3. Book will be send to donee, nothing more to care about.

Book gift voucher sampleRead more

More about Introduction to Focused Ion Beam Nanometrology

You get 281 loyalty points

Book synopsis

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.

Book details

Book category Books in English Technology, engineering, agriculture Technology: general issues Instruments & instrumentation engineering

111.94 €

Trending among others

All about us



Shopping guide
Digest
Books by language
Payment
Delivery 2.99 €

Collection points Bratislava a 2642 dalších

Slovensko
България Hrvatska România Magyarország Polska Česko

Copyright ©2008-24 najlacnejsie-knihy.sk All rights reservedPrivacyCookies

Account: Log in
Všetky knihy sveta na jednom mieste. Navyše za skvelé ceny.

Shopping cart ( Empty )

For free shipping
shop for 59,99 € and more

You are here: