Code: 01424651
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-base ... more
121.21 €
Potřebujete více kusů?Máte-li zájem o více kusů, prověřte, prosím, nejprve dostupnost titulu na naši zákaznické podpoře.
You get 304 loyalty points
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.
Book category Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering
121.21 €
Collection points Bratislava a 2642 dalších
Copyright ©2008-24 najlacnejsie-knihy.sk All rights reservedPrivacyCookies
Shopping cart ( Empty )