Code: 01391053

Frontiers of Characterization and Metrology for Nanoelectronics

Name: Frontiers of Characterization and Metrology for Nanoelectronics
Brand: Springer, Berlin
SKU: 01391053
Price: 153.95 EUR
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by David G. Seiler, Alain C. Diebold, Robert McDonald

Language: English
Binding: Hardback
Number of pages: 578
Publisher: Springer, Berlin, 2007
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Book synopsis

This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry s characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development.

Book details

153.95 €

Full title: Frontiers of Characterization and Metrology for Nanoelectronics
Subtitle: 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Author: David G. Seiler, Alain C. Diebold, Robert McDonald
Language: English
Binding: Hardback
Number of pages: 578
EAN: 9780735404410
ID: 01391053
Publisher: Springer, Berlin
Weight: 1586 g
Dimensions: 279 × 216 × 41 mm
Published: 2007