Factors influencing child maltreatment among families leaving TANF / Najlacnejšie knihy
Factors influencing child maltreatment among families leaving TANF

Code: 06885856

Factors influencing child maltreatment among families leaving TANF

by David Beimers

The transition off Temporary Assistance to Needy Families (TANF) can be a critical period for a family and one which can result in risk of child maltreatment for children. This study examined the experiences of over 18,000 familie ... more

55.42

RRP: 61.45 €

You save 6.02 €


In stock at our supplier
Shipping in 8 - 10 days
Add to wishlist

You might also like

Give this book as a present today
  1. Order book and choose Gift Order.
  2. We will send you book gift voucher at once. You can give it out to anyone.
  3. Book will be send to donee, nothing more to care about.

Book gift voucher sampleRead more

More about Factors influencing child maltreatment among families leaving TANF

You get 140 loyalty points

Book synopsis

The transition off Temporary Assistance to Needy Families (TANF) can be a critical period for a family and one which can result in risk of child maltreatment for children. This study examined the experiences of over 18,000 families that exited TANF during a four-year period (1999 to 2002) and the factors that influenced subsequent child maltreatment. Families that experienced an involuntary exit from TANF, such as a sanction or time limits, were at increased risk of a child maltreatment investigation and risk of a substantiated finding of maltreatment. Furthermore, mothers with greater employment earnings were at reduced risk of alleged maltreatment and of substantiated maltreatment. Implications for policy and practice are examined.

Book details

55.42

Trending among others



Collection points Bratislava a 2642 dalších

Copyright ©2008-24 najlacnejsie-knihy.sk All rights reservedPrivacyCookies


Account: Log in
Všetky knihy sveta na jednom mieste. Navyše za skvelé ceny.

Shopping cart ( Empty )

For free shipping
shop for 59,99 € and more

You are here: