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Book synopsis

Presenting information on electrostatic discharge (ESD) and the characterization of semiconductor devices, this book examines ESD physical models and discusses the test systems and testing and specifications of each model, including the RF ESD test systems and magnetic recording (MR) systems and latchup. Other topics covered include ESD testing of input circuits and power clamps and more advanced technologies such as CMOS and RF CMOS, Bipolar, and BiCMOS characterization. It further exposits on established test structures and design, such as ESD technology and benchmarking.

Book details

Book category Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Full title: ESD Testing - From Components to Systems
• Author: Steven H. Voldman
• Language: English
• Binding: Hardback
• Number of pages: 328
• EAN: 9780470511916
• ISBN: 0470511915
• ID: 04884089
• Publisher: John Wiley & Sons Inc
• Weight: 652 g
• Dimensions: 252 × 172 × 21 mm
• Date of publishing: 02. December 2016

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