Code: 09062252
Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technolog ... more
132.12 €
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Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here.§
Book category Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering
132.12 €
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