The Practice of Tof-Sims: Time of Flight Secondary Ion Mass Spectrometry / Najlacnejšie knihy
The Practice of Tof-Sims: Time of Flight Secondary Ion Mass Spectrometry

Code: 12371627

The Practice of Tof-Sims: Time of Flight Secondary Ion Mass Spectrometry

by Alan M. Spool

Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides un ... more

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Book synopsis

Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity alo

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