The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition / Najlacnejšie knihy
The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition

Kod: 17214632

The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition

Autor Department of Commerce

This Special Publication summarizes the certification procedure for a new generation of silicon resistivity Standard Reference Materials 2541 through 2547.

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This Special Publication summarizes the certification procedure for a new generation of silicon resistivity Standard Reference Materials 2541 through 2547.

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